试产生及诊断软体brains （Bist for Ram In Seconds），优化3-D IC中的记忆体自我测试电路（BIST，Built In-Self Test）。
基于8个网页-相关网页
built-in self test 内置自测试 ; 内建自我测试 ; 内建自测
Built In Self Test 自检 ; 建自检
Automatic Built-In Self-Test 自动化内置自测试
Built-In Self-Test 建式自我测试 ; 内建自我测试
logic built in self test 中逻辑内建自测试 ; 逻辑内建自测试
memory built-in self-test 存储器内建自测试
autonomous built-in self-test 自律内建自测
BIST Built-in Self Test 机内自我测试
Built-in Self-Test Architecture 内建自我测试的结构
Built-In self test: An electrical testing method that allows the tested devices to test itself with specific added-on hardware.
嵌入式自测试：一种在特别添加的硬件中允许被测元件自我测试的电子测试方法。
This paper presents a new structure of analog Built - in Self - Test circuit (ABIST) consisting of analog multiplexers.
本文提出了采用模拟多路开关的模拟内建自测试电路abist的一种新结构。
Built-in self-test (BIST) is used as an effective test technique and it can greatly reduce test overheads.
内建自测试(BIST)作为一种有效的测试技术可以大大地降低测试开销。
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