原子力显微镜扫描对醛基化玻片表面形貌进行分析。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
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