简要介绍了评定表面粗糙度参数的基准线及其主要的两个轮廓高度评定参数，详细阐述了重庆大学研制成功的一种高精度原子力显微镜——AFM。
The datum line and mainly three profile height parameters of surface roughness are briefly introduced and the operation principle and system structure of AFM.
从而，扩大了只用于测量单参数的表面粗糙度检查仪的使用功能，以满足表面粗糙度国家标准所规定的评定参数的要求。
By this method, the function of the instrument is extended and can satisfy the requirement of the surface roughness national standard. The program flow chart is given.
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