边界扫描测试技术是通过在内部逻辑的边界和外部引腿之间增加条扫描链和测试访问端口，测试激励信息，串行传送的测试方法。边界扫描测试也用厂系统芯片(SOC)内部的各模块的测试。
答:边界扫描测试技术(Boundary Scan Testing,BST),主要用于解决可编程逻辑器件芯片的测试问题。这种测试可在器件正常工作时捕获功能数据。
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Boundary-Scan Register Cell 所以被称为边界扫描寄存器 Boundary-Scan Test Architecture 边界扫描测试技术 Boundary-Scan-Kette JTAG 通过边界扫描键 ..
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... 边界扫描描述语言 BSDL ; scan description language 边界扫描测试技术 Boundary Scan Test ; Scan Test Architecture 边界扫描技术 Boundary SCAN ...
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和边界扫描测试技术 Boundary Scan Testing
本文详细介绍了边界扫描测试的原理、结构，讨论了边界扫描测试技术的应用。
The working principle and architecture of BST is introduced in this paper and its applications are discussed.
研究了目前较常用的边界扫描测试技术的原理、结构，并给出了边界扫描技术的应用。
In this paper, the theory and architecture of boundary scan test technology is introduced and researched, then its application is given.
介绍了数据采集的原理和ASIC的基本功能、实现以及JTAG的边界扫描测试技术。
In this paper, the principle of data collection, the basic function and implementation of asic and the technology of JTAG BST are presented.
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