The edge pre-breakdown of planar-type avalanche photodiode (APD) is resulted from the intense electric field at the junction bend.
平面型雪崩光电二极管(APD)在结弯曲处具有高的电场，导致在结边缘的提前击穿。
A photon counting image model based on avalanche photodiode (APD) arrays response characters and Poisson point process of photons was developed.
简要介绍了雪崩光电二极管(APD)阵列光子计数成像原理，建立了基于泊松点过程的APD阵列的单光子响应模型。
Avalanche photodiode APD bias circuit generated.
雪崩光电二极管apd的偏压产生电路。
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