Build in Self Test 内建自测试法 ; 自测试
Build-In Self Test 叫做内置自检
build-in-self-test 内建自我测试 ; 测试
Build-In-Self-Test for Software 软件内建自测试
logic build in self test 逻辑内建自测试
As a new method of design for testability build-in self-test can prominently improve the testability of the circuits.
内建自测试作为一种新的可测性设计方法，能显著提高电路的可测性。
Based on the research of primary DFT method and the structure characteristic of designed CPU, the article combines the boundary scan and Build-In Self-Test based on BILBO to test.
本文在对目前主要的可测性设计方法进行研究的基础上，根据所设计CPU的结构特点，采用了边界扫描技术和基于BILBO的内建自测试技术结合的可测性设计方案。
Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试(BIST)。
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