...文档检索 行政院国家科学委员会专题研究计画 2010-7-26【PDF】【预览/下载】 适合 使用于内 建式自我测试(Built-In Self-Test, BIST) 设计,此架构主要包括..
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built-in self test 内置自测试 ; 内建自我测试 ; 内建自测
Built In Self Test 自检 ; 建自检
Automatic Built-In Self-Test 自动化内置自测试
logic built in self test 中逻辑内建自测试 ; 逻辑内建自测试
memory built-in self-test 存储器内建自测试
autonomous built-in self-test 自律内建自测
Built In-Self Test 自我测试电路
BIST Built-in Self Test 机内自我测试
Built-in Self-Test Architecture 内建自我测试的结构
Built-in Self-Test (BIST) has become an important approach for testing VLSI that reduces test complexity and cost.
内建自测试(BIST)技术已成为解决VLSI测试难题和降低测试成本的重要手段。
参考来源 - 基于累加器的DSP数据通路的内建自测试技术的研究·2,447,543篇论文数据，部分数据来源于NoteExpress
以上来源于: WordNet
Built-in self-test (BIST) is used as an effective test technique and it can greatly reduce test overheads.
内建自测试(BIST)作为一种有效的测试技术可以大大地降低测试开销。
A low power test approach for test or built-in self-test based on arithmetic additive generator is proposed in this paper.
本文提出了一种基于算术加法生成器的测试或内建自测试的低功耗测试方法。
Reseeding is a built-in self-test (B. IST) testing method, which is used to improve fault coverage of pseudo-random testing.
重新播种的测试方法是一种内建自测试方法，它可以用来提高伪随机测试矢量的故障覆盖率。
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