We adopted Gaussian beam, ray tracing and vector diffraction integration together to analyze single beam spot-focusing lens antenna.
本文采用将高斯波束法，射线追迹和矢量衍射积分相结合的方法来分析单波束的点聚焦透镜天线。
The experiments , comparison and analysis for the three thickness measurement methods :two-beam diffraction method , contamination spot method and contamination line method were carried out.
前言： 对用电子显微镜测量薄膜厚度的三种方法：双束衍射法、污斑法、污线法进行了实验及比较分析。
The straight-edge diffraction of this parallel beam superposing on the light spot constitutes the so-called M-line.
这束平行光的直边衍射花纹与光斑本底叠加的结果在观察屏上形成为通常所称的M线。
应用推荐