Diffusion Under epitaxial Film 外延膜下扩散
gan epitaxial film gan外延膜
lead-tin sulfide epitaxial film 硫化锡铅外延膜
diffusion under the epitaxial film 外延膜下扩散
epitaxial substrate film 外延衬底膜
epitaxial polycrystalline film 外延多晶膜
epitaxial Si film 并降低硅磊晶膜
epitaxial thin film 外延薄膜
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Epitaxial growth steps and growth spirals were observed from epitaxial film appearance photograph.
从外延形貌照片中观察到了外延生长台及生长螺线。
The surface smoothness of the single crystal substrate will be the most important factor, which influences the quality of the epitaxial film growth.
单晶基片的表面光洁度指标是影响后续薄膜生长质量的重要因素。
Film thickness measurements, bicrystal X-ray diffraction experiments and surface and cross-sectional micro-photographs taken by S. E. M. for epitaxial films are also discussed.
文中还对多层膜的膜厚测量、X射线双晶衍射实验以及扫描电镜的表面象和剖面象进行了分析。
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