field emission electron microscope 场致发射电子显微镜 field emission ion microscope 场致发射离子显微镜 field emission microscope 场致发射显微镜 ..
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field ion emission microscope 场离子发射显微镜 ; 场离子发射目镜
field d emission ion microscope 场致发射离子显微镜
field displacement emission ion microscope 场致发射离子显微镜
·2,447,543篇论文数据，部分数据来源于NoteExpress
Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.
采用聚焦离子束和场发射扫描电镜对处于临界破坏状态的节瘤缺陷做剖面分析和观察。
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