The quantity conditions of film thickness and refractive index control were acquired. The basic facture technics of branched PMPS waveguide circuit was established.
实验归纳了支化聚甲基苯基硅烷薄膜的光折变规律，获得了控制薄膜厚度和折射率的定量条件。
The principle, circuit design and technical index of the micrometer are presented.
本文介绍了该仪器的工作原理、测量电路的设计特点及其技术性能指标。
Experimental results indicate that the circuit does improve the index of CSO and CTB.
实验测试结果表明该电路能改善CTB、CSO指标。
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