The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
The absorption peaks of new groups generated from some crosslinking reactions are found in the FT-IR spectra.
此外，光谱中还出现了一些共价交联反应中所生成的典型的新基团吸收峰。
The spectra of cation golden yellow bismuth are studied by visible absorption spectra and IR spectra.
并对产物进行了铋含量的测定，测定了产物的可见光吸收光谱、 红外光谱。
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