In power IC, crosstalk between high voltage power devices and low voltage devices can cause circuit operation failure and even latch-up.
在功率集成电路中，高压功率器件会对周围的低压电路产生串扰，从而造成电路失效甚至闭锁等现象。
Transient gamma irradiation experiment on "Qiangguang I" indicates that a latch-up window appears in the test circuit as predicated.
“强光i”瞬时伽马辐照实验显示，实验电路像预计的那样出现了闭锁窗口。
应用推荐