• 闩锁效应 - 引用次数：4

  Latch-up effect is one of main cause that CMOS IC becomes invalid in application,and as device channel length becomes smaller and smaller,Latch-up effect in CMOS structure is stand out increasingly.

  闩锁效应是CMOS集成电路在实际应用中失效的主要原因之一,而且随着器件特征尺寸越来越小,使得CMOS电路结构中的闩锁效应日益突出。

  参考来源 - CMOS集成电路闩锁效应抑制技术

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