Ellipsometry is an optical analytical technique used to determine the optical constants and the film thickness from measurements of the change in polarization state of reflecting light.
椭圆偏振测量是一种通过分析偏振光在待测薄膜样品表面反射前后的偏振态的改变来获得薄膜材料的光学常数和薄膜厚度的高精度、非接触测量方法。
The effects of optical medium including light beam splitter and reflecting metallic film on laser polarization state in a coherent CO_2 lidar are discussed.
讨论了红外相干激光雷达中光学介质对偏振光束的影响程度，包括光束分束片和反射镜片的影响，给出了定量的结果。
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