This paper introduces the principle of waveguide microwave leak test system, illustrates the formation and the realization of amplitude measurement unit and display-control unit in detail.
介绍了波导微波泄漏检测系统的原理，并对其中的幅度测量单元、显控单元的组成和实现作了详细的阐述。
The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
This system is applied to the measurement of microwave ECR plasma inner parameters and proved to work well.
将该系统应用于微波ecr等离子体参数的测定，经实验测试效果较好。
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