The automatic measurement system and the data processing method are discussed for microspot photocurrent spectrum and reflection spectrum of semiconductor optoelectronic devices.

叙述了为测量半导体光电器件的光电流谱和光反射谱所构成的自动测量系统及其数据处理方法。

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Finally, this paper analyzed and discussed the testing method of three electrodes, feature of the new LAPS and the infections of conductance of waiting testing electrolyte on photocurrent.

最后，分析讨论了三电极测量方法和新型LAPS结构特色、以及LAPS电解质电导对光电流的影响等。

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Experiment using discrete bipolar transistors has been performed to verify the effect of the photocurrent compensation method.

采用标准分立双极元件，对双极晶体管瞬态辐射光电流分流补偿法进行了实验验证。

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