quantitative electron probe x-ray microanalysis 电镜x射线显微定量分析
METHODS: Electron probe quantitative and position microanalysis was used to measure the depth and element composition of the reaction layer of the Ti-porcelain.
方法:利用电子探针定点定量分析方法测量钛瓷反应层厚度及元素构成情况。
The present correction program was compared to other recently proposed correction procedure for quantitative electron-probe microanalysis.
把我们的修正程序与其它几个最近提出的定量电子探针分析的修正程序作了比较。
The correction programs for light elements quantitative electron-probe microanalysis have been performed.
完成了轻元素定量电子探针分析的修正程序。
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