The subject of analysis and inspection of semiconductor optoelectronic film is one of the most important problems for device development.

半导体光电薄膜的分析和检测是器件开发中必须首先要解决的重要问题之一。

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Semiconductor optical amplifier (SOA) is an important device in future all-optical communications due to its small volume, low cost and easy integration with other optoelectronic devices, etc.

半导体光放大器（SOA）由于体积小、成本低、易与其他光电器件集成，在未来的全光通信系统中将发挥重要的作用。

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