The nano dots fabrication tests of Au film and single-crystal silicon were performed in air using scanning tunneling microscope(STM).
研究了大气状态下应用扫描隧道显微镜（ STM）对金薄膜和单晶硅材料进行了纳米级电场加工实验。
Select a soluble europium salt solution as the raw material, and deposit the thin film on the single crystal silicon wafer by utilizing a three-electrode electrochemical cell.
选择可溶性铕盐溶液为原料，利用三电极电化学池在单晶硅片上进行薄膜沉积。
A layer of europium oxide red light luminescent thin film is deposited on one side surface of a single crystal silicon substrate.
在单晶硅衬底的一个侧面沉积有一层氧化铕红光发光薄膜。
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