A simple formula for calculating the interfacial roughness of multilayer by using the small Angle X ray diffraction curves of the samples is given.
提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
The change of the crystalline structure of UHMWPE fiber was studied by small angle X-ray scattering (SAXS) , wide angle X-ray diffraction ( WAXD) and Raman spectroscopy.
利用小角X光散射（SAXS）、广角X射线衍射（WAXD）及拉曼光谱等测试手段，研究了拉伸过程中UHMWPE纤维的结晶结构变化。
The interlayer space of lamellar liquid crystal was deter-mined by small angle X-ray diffraction.
用小角度X射线衍射方法测定了层状液晶各种组分变化的层间距离；
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