The structure and surface morphology of the thin films were characterized by means of XRD and SEM.
用X射线衍射，扫描电镜对薄膜进行了结构表征。
This is ideal optical instrument for micro observation in metallographic structure and surface morphology. It is suitable for research in metallography, mineralogy, precision engineering, etc.
适用于金相组织及表面形态的显微观察，是金属学、矿物学、精密工程学研究的理想仪器。
The characterization methods for the microstructure, including micropore structure, surface morphology and topography of carbon molecular sieves (CMS), were reviewed in this paper.
综述了国内外表征碳分子筛(CMS)微结构包括微孔结构、表面形态与形貌的主要方法。
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