组合电路测试生成算法研究——毕业论文_论文 关键词 测试生成;固定型故障;时滞故障 [gap=2584]Keywords test generation, stuck-at fault, delay fault
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Stuck-at Fault Model 固定故障模型
stuck at fault 受干扰故障
Single Stuck-At fault 单固定故障 ; 故障
Single Stuck-at Fault Model 单固定故障模型
SAF-Stuck At Fault 固定故障
stuck at 0 fault 固定0故障
stuck at 1 fault 固定1故障
stuck-at port fault 单固定故障
stuck at x fault 固定x故障
以上来源于: WordNet
Based on the stuck-at fault analysis, state test generation for synchronous circuits is presented.
通过分析时序电路固定故障的状态变换,提出基于状态隐含变换的测试方法。
Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.
基于固定型故障模型的测试方法已不能满足高性能集成电路,尤其是对CMOS电路的测试要求。
At present the commonly used fault models mainly consist of stuck-at fault, stuck-open fault, bridge fault, store fault, delay fault, etc.
目前常用的故障模型主要有:固定故障,开路故障,桥接故障,存储故障,时滞故障等。
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