Time-of-Flight secondary ion mass spectrometry (TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.
飞行时间二次离子质谱（TOF- SIMS）是一种非常灵敏的表面检测技术。
Solid surface luminescence is a sensitive analytical technique which is very useful for the analysis of trace poisonous organic pollutants in environmental samples.
固体表面发光技术是一种灵敏的分析技术，对于环境样品中痕量有毒有机污染物的分析十分有用。
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