X-ray electron probe microanalysis techniques X射线电子探针显微分析技术
electron probe X-ray microanalysis 电子探针X射线微区分析
quantitative electron probe x-ray microanalysis 电镜x射线显微定量分析
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析（XRD）、扫描电镜（SEM）等观察分析了复合粉涂层表面形貌，分析了表面微裂纹和孔隙的形成过程。
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