... x ray flaw detection x 射线探伤 x ray fluorescence spectroscopy x 射线荧光光谱分析 x ray metallography x 射线金相学 ...
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The two main techniques that are discussed in this book are the x-ray fluorescence spectroscopy (XRF) and the x-ray fine structure analysis (XAFS).
被在这本书里讨论的两种主要技术是X光莹光分光学（XRF）和X光好的架构分析（XAFS）。
We utilized the electrochemistry, scanning electron micrograph, X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy to demonstrate this mechanism.
我们用电化学方法、扫描电镜、X射线光电子能谱和X射线荧光光谱法对此进行了证明。
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