As with the four-point collinear probe method, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.
与四点同线探针法一样，如果样品电阻和电压表的绝缘电阻（电压表的公共端到地）是同一数量级的，就可能需要使用差分测量。
The method to make four point probe instrument is provided.
并提供了自制四探针测量仪的方法。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
应用推荐