In this paper, the fundamental principle and the experiment method of ATR and the it's application in the analysis the aligning properties of the nematic liquid crystal CP 9001 LA arc introduced.
本文介绍了衰减全反射法的基本原理、实验方法并将它应用于探测向列相液晶CP—9001 LA的排列性质。
The latter is a fully analytical MOSFET model dedicated to the analysis and design of low-voltage low-power analog circuits and completely built on fundamental physical properties.
后者是专用于分析和设计低压低功耗模拟电路的全解析型MOSFET模型。
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