reflection-absorption infrared spectra
reflection-absorption infrared spectra
反射-吸收红外光谱
以上为机器翻译结果，长、整句建议使用 人工翻译 。
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The characterization of SiN thin films was studied by spectral ellipsometry, reflection spectra, infrared absorption spectroscopy (IR) and quasi-steady state photoconductance (QSSPC) measurements.
利用椭圆偏振光谱、反射谱、红外吸收谱和准稳态光电导（QSSPC）分析了氮化硅薄膜的特性。
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