X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.
通过X射线粉末衍射（XRD）、扫描电镜（SEM）、透射电镜（TEM）以及荧光光谱对获得的试样进行了表征。
TEM and XRD were used to characterize the microstructure and crystal structure of carbon spheres.
采用TEM和XRD对碳球的微观结构和晶体结构进行表征。
Optical microscopy, XRD, SEM, tem and SAED are used to systemically characterize the morphology and structure of silver nanostructures.
采用光学显微镜、XRD、SEM、TEM、SAED等手段，表征纳米材料的尺寸、形貌、组成和晶体结构。
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