The interaction forces between the tip and sample is used to acquire 3-dimentional image of the samples in atomic force microscopy(AFM).
原子力显微技术利用探针尖端与标本之间相互作用的力场对标本进行三维成像。
The interaction forces between the tip and sample is used to acquire 3-dimentional image of the samples in atomic force microscopy(AFM).
原子力显微技术利用探针尖端与标本之间相互作用的力场对标本进行三维成像。
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