• The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber.

    用俄歇电子能谱(AES)研究了高真空下,环境温度对铀铌合金真空氧化膜的影响。

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  • The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).

    采用扫描电镜、能量色散谱和俄歇电子能谱检测方法,对银币表面缺陷进行了分析。

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  • The composition of the implanted layer was analysed with Auger electron spectroscopy.

    用俄歇能谱仪对注入层的成分进行了分析。

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  • The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported.

    报道了对扫描探针电子能谱仪(SPEES)中俄歇电子出射的理论模拟研究。

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  • Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given.

    给出了利用JAMP - 10型俄歇电子谱仪进行定量分析(包括深度定量分析)的一些结果。

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  • The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES).

    用俄歇电子谱(aes)分析了铀试样处理前后表层的成分变化。

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  • This conclusion is supported by Auger electron spectroscopy data, which show a chromium uptake in the outer layers of the immersed films.

    这一结论得到了俄歇电子能谱分析的佐证,因为在浸泡过的膜的外层发现有铬的存在。

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  • Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.

    用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。

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  • From Auger Electron Spectroscopy, it has been found that the outer layer of a rouge film is carbon rich, and the underlying region is iron and oxygen rich, probably iron oxide.

    通过欧杰电子能谱仪,发现水锈膜外层富含碳,在下层富含铁和氧,可能是氧化铁。

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  • The content of this article includes Auger electron emission, surface sensitivity, measurement of Auger electron spectrum, qualitative and quantitative analysis, depth profile etc.

    俄歇电子发射,表面灵敏性,俄歇电子谱的测量,定性和定量分析,深度剖析等。

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  • The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.

    结合俄歇电子能谱和红外光谱分析膜的微观结构,对薄膜的电子注入特性进行了理论分析与讨论。

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  • The characteristics of the electron_injected film were analyzed and discussed, in terms of the microstructure analyses in the film with the Auger electron spectroscopy and the infrared spectrum.

    结合俄歇电子能谱和红外光谱分析膜的微观结构,对薄膜的电子注入特性进行了理论分析与讨论。

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