An optical profilometer, based on the principle of the differential interference microscope, has been developed.
提出了一种基于微分干涉原理的光学形貌仪。
In addition, the observed result of the theoretical experiment, and a comparison to the result from a differential interference microscope is also provided.
同时给出了该方法原理性实验的观察结果,并与微分干涉显微镜的观察结果进行了对比。
In addition, the observed result of the theoretical experiment, and a comparison to the result from a differential interference microscope is also provided.
同时给出了该方法原理性实验的观察结果,并与微分干涉显微镜的观察结果进行了对比。
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