The principle and structure of laser shearography and electronic speckle interferometry were introduced. Speckle pattern was disposed and analysed.
介绍了研制的激光电子剪切散斑干涉成像系统的原理及结构组成，对散斑图像进行了图像处理分析。
Electronical Speckle Pattern Interferometry (ESPI) is an advance technology with all electronic image record, reconstruction and computer-aided image process.
电子散斑干涉是一种利用全电子记录和计算机图象处理系统替代传统照相干版进行测量的先进技术。
Noise reduction is one of the most exciting problems in electronic speckle pattern interferometry.
去除噪声是电子散斑干涉测量技术的研究热点之一。
Electronic speckle pattern interferometry principle and phase measurement technology in the speckle interferes is introduced2.
系统介绍了电子散斑干涉的原理及散斑干涉中的位相测量技术。
Electronic speckle pattern interferometry(ESPI) is an important branch of optical measurement techniques.
电子散斑干涉测量技术是光学测量技术的一个重要分支。
Traditional speckle fringe patterns by electronic speckle pattern interferometry (ESPI) are inherently noisy and of limited visibility, so denoising is the key problem in ESPI.
原始的电子散斑干涉条纹图中含有很强的颗粒性噪声，对比度很差，因此去除噪声是电子散斑干涉测量技术的关键问题。
This technic has been used in the instrument of IC wafer Stress Analyzer and Shear Electronic Speckle Pattern Interferometry (SESPI).
最后将错位相移器应用于集成电路硅片薄膜应力分布测试仪及错位电子散斑干涉仪之中。
This technic has been used in the instrument of IC wafer Stress Analyzer and Shear Electronic Speckle Pattern Interferometry (SESPI).
最后将错位相移器应用于集成电路硅片薄膜应力分布测试仪及错位电子散斑干涉仪之中。
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