The authors show that using the half-wave strip method to deduce the bright and dark fringe conditions of Fraunhofer grating diffraction is simpler than the amplitude vector method.
本文用半波带法对夫琅禾费光栅衍射进行分析该方法和常用的振幅矢量法相比,分析衍射条纹的位置更要快捷,明了。
The authors show that using the half-wave strip method to deduce the bright and dark fringe conditions of Fraunhofer grating diffraction is simpler than the amplitude vector method.
本文用半波带法对夫琅禾费光栅衍射进行分析该方法和常用的振幅矢量法相比,分析衍射条纹的位置更要快捷,明了。
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