These results of this paper may be of use in designing focusing or deflection systems of electron ray devices, electron-optical instruments and high energy accelerators.
这些结果可用于电子束器件、电子光学仪器和高能加速器中的聚焦或偏转或聚焦兼偏转元件的设计。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
The nanowires were analyzed by X-ray diffraction, high resolution electron microscopy (HREM), electron energy loss spectroscopy.
应用X射线衍射仪、高分辨电子显微镜和电子能量损失谱分析了纳米线的微观结构。
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