An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper.
本文提出了扫描设计中存储元件在扫描链中的最优排序方法。
An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper.
本文提出了扫描设计中存储元件在扫描链中的最优排序方法。
应用推荐