Methods: studying growth and aggregation of COM crystals using the scanning electron microscopy (SEM).
方法：利用扫描电子显微镜（SEM）观察COM的生长和聚集。
The worn surfaces of the steel balls were analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS).
用扫描电子显微镜(sem)和X射线光电子能谱仪(XPS)对钢球磨损表面进行了分析。
The effects of solvent, surfactant on the process of electrospinning and the morphology of the electrospun nanofibers were studied with scanning electron microscopy(SEM).
利用扫描电子显微镜探讨了不同的溶剂体系和表面活性剂对纺丝过程及纳米纤维形态的影响。
Worn surface morphology and element chemistry configuration of steel ball were analyzed by means of X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM).
用扫描电子显微镜和X射线光电子能谱仪观察分析了磨损表面形貌和元素化学形态。
The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).
采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨痕进行表面分析。
The scanning electron microscopy (SEM) indicated that the adhesion at the interface could be enhanced by PP-HBP and the phase separation of PP/PVC blends could be reduced.
扫描电子显微镜（SEM）研究结果证明，PP-HBP增强了PP/PVC的界面粘结作用，减小了共混体系的相分离程度。
Surface morphologies were observed by scanning electron microscopy (SEM), and X-ray diffraction (XRD) was used to analyze the crystal corrosion products.
采用扫描电子显微镜(SEM)观察表面腐蚀形貌，XRD进行腐蚀产物分析。
The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS). The morphology of the coatings was observed by scanning electron microscopy (SEM).
采用能量色散x射线谱(EDS)分析得出涂层成分，利用扫描电子显微镜(SEM)观察涂层形貌。
The compositions of the coatings were analyzed by energy dispersive X-ray microanalysis system (EDS), and the morphology of the coatings was observed by scanning electron microscopy (SEM).
采用能量色散x射线谱(EDS)分析得出镀层成分，利用扫描电子显微镜(SEM)观察镀层形貌。
The surface morphology and the component of the film has been analyzed by scanning electron microscopy (SEM) and X-ray photoelectron spectrometer (XPS).
并利用扫描电子显微镜(sem)和x -射线光电子谱(XPS)对薄膜的形貌和组分进行了表征。
The morphological changes of diamond coatings with variation of process parameters can easily be seen by scanning electron microscopy (SEM).
通过扫描电子显微镜(SEM)很容易看到，金刚石涂层的形貌因工艺参数的变化而变化。
The synthesized zeolites were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM).
分别采用X射线衍射（XRD）和扫描电子显微镜（SEM）对样品进行了表征。
We observe the morphology image of the samples by scanning electron microscopy (SEM), and measure the transmission spectrum and the polarization spectrum of the samples by the spectrophotometer.
用扫描电子显微镜观察了样品的形貌结构，用分光光度计测量了样品的透射光谱和偏振光谱。
The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
The constituents and the structures of the diamond films have been identified by means of scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffraction.
利用扫描电子显微镜（SEM ）、显微喇曼光谱、X射线衍射等手段对合成的金刚石薄膜的成分与结构进行了分析。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The fracture morphology of PC, PA6, LDPE is analyzed by using scanning electron microscopy (SEM), and the fracture cause, fracture process and fracture morphology are discussed respectively.
利用扫描电子显微镜观察分析了聚碳酸酯、尼龙6、低密度聚乙烯的微观断裂行为，并对其断裂起因、断裂过程及断裂形态进行了讨论。
The adherence of 19 SE strains isolated from patients was assayed by three different methods, namely, quantitative adherence assay, scanning electron microscopy (SEM) and light microscopy.
用半定量粘附实验、扫描电子显微镜法和光学显微镜法检测自临床分离到的19株表葡的粘附能力。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) were used to evaluate the structure and composition.
利用扫描电子显微镜(sem)、透射电子显微镜(tem)和X射线光电子谱(XPS)对样品的形貌、结构及组份进行表征。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针（EPMA）、X衍射（XRD）和扫描电镜（SEM）查证了其组分、相结构和显微结构的梯度分布。
Morphology and chemical composition of fly ash residues of pozzolanic reaction were investigated by scanning electron microscopy (SEM) and electron probe microanalysis (EPMA).
采用扫描电镜和电子探针等分析手段研究了粉煤灰火山灰反应残渣的形貌和化学组成。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
Fracture surfaces and secondary cracks morphologies were observed using scanning electron microscopy (SEM).
用扫描电镜对断口及二次裂纹形貌进行观察。
The as-obtained products were characterized with scanning electron microscopy (SEM) and X-ray diffraction (XRD).
并分别用扫描电镜和粉末X射线表征其形貌和相结构。
Scanning electron microscopy (SEM) was used to further explore the surface ultrastructure of selected ECM scaffolds.
应用扫描电镜进一步探测每种ECM支架的表面超微结构。
A high speed image scanning system was designed to meet the requirement of fast scanning large images, which was based on scanning electron microscopy (SEM).
为满足快速扫描大面积图形的需要，设计了基于扫描电镜的高速图形检测系统。
The obtained products were characterized by powder X-ray diffraction (XRD), scanning electron microscopy (SEM), and field-emission scanning electron microscopy (FE-SEM).
利用粉末X射线衍射（XRD）、扫描电镜（SEM）和场发射扫描电镜（FE-SEM）对所得产物进行表征。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
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