Two test technologies state stable based technology and automatic test technology are given for the test of logic functions of sequential circuit.
及对时序电路逻辑功能的两种检测技术：基于状态表的测试技术和自动检测技术。
Two test technologies state stable based technology and automatic test technology are given for the test of logic functions of sequential circuit.
及对时序电路逻辑功能的两种检测技术：基于状态表的测试技术和自动检测技术。
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