The technique of measurement of growth, rate of fatigue short crack with indirect KC (IDC) potential system and AC potential system was investigated.
木文研究了间接直流电位法（IDC法）和交流电位法（AC法）用于监测疲劳短裂纹扩展速率的有关技术问题。
The short cracks deflect more severe in coarse grain structure than in fine grain one, result in roughness induced crack closure effect, therefore exhibit slow crack growth rate.
粗晶组织比细晶组织的裂纹偏折更大，粗糙度诱发闭合效应更强，因而裂纹扩展较幔。
The short cracks deflect more severe in coarse grain structure than in fine grain one, result in roughness induced crack closure effect, therefore exhibit slow crack growth rate.
粗晶组织比细晶组织的裂纹偏折更大，粗糙度诱发闭合效应更强，因而裂纹扩展较幔。
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