The invention realizes single crystal probe measurement or double crystal probe measurement on one ultrasonic thickness gauge, to improve test efficiency.
本发明在同一台超声测厚仪上实现单晶探头测量方式或双晶探头测量方式，提高了测试效率。
The invention realizes single crystal probe measurement or double crystal probe measurement on one ultrasonic thickness gauge, to improve test efficiency.
本发明在同一台超声测厚仪上实现单晶探头测量方式或双晶探头测量方式，提高了测试效率。
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