The degradations of device output conductance, subthreshold conduction and RF characteristics are also analyzed.

对器件的亚阈区导电和RF等特性的热载流子退化，也作了相应的分析。

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The degradations of device output conductance, subthreshold conduction and RF characteristics are also analyzed.

对器件的亚阈区导电和RF等特性的热载流子退化，也作了相应的分析。

youdao