As a standard DFT method, IEEE 1149.1 boundary-scan technique (BST) provides measures to complex interconnect test and can well make up the shortcoming of traditional test techniques.
基于IEEE 1149.1标准的边界扫描技术(BST)作为一种标准化的可测性设计方法，弥补了传统测试的缺陷，为复杂的电路互连提供了测试手段。
As a standard DFT method, IEEE 1149.1 boundary-scan technique (BST) provides measures to complex interconnect test and can well make up the shortcoming of traditional test techniques.
基于IEEE 1149.1标准的边界扫描技术(BST)作为一种标准化的可测性设计方法，弥补了传统测试的缺陷，为复杂的电路互连提供了测试手段。
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