An easy technique to de-embed the S-parameters of an arbitrary microstrip two -port is introduced.
介绍了在低成本夹具上，任意微带结构二端口网络S参数去嵌入的方法；
The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to DE - embed the s parameters from the microwave transistor test fixture.
由于利用代数消去法，去除了嵌入参量相位不确定性引入的误差，LRL法可用于微波晶体管测试夹具的去嵌入。
The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to DE - embed the s parameters from the microwave transistor test fixture.
由于利用代数消去法，去除了嵌入参量相位不确定性引入的误差，LRL法可用于微波晶体管测试夹具的去嵌入。
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