• Electron probe microanalysis shows that the inhomogeneous distribution of water content has no direct relation with the chemical composition of the mineral.

    电子探针结果表明水含量分布不均与矿物化学成分无直接关系。

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  • Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.

    扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。

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  • Reasons of failure in cooling pipe of the reactor have been studied by the chemical composition analysis, optical microscopy examination and electron probe microanalysis.

    应用化学分析、金相和电子探针显微分析技术对反应器中冷却水管的失效原因进行了分析。

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  • Morphology and chemical composition of fly ash residues of pozzolanic reaction were investigated by scanning electron microscopy (SEM) and electron probe microanalysis (EPMA).

    采用扫描电镜和电子探针等分析手段研究了粉煤灰火山灰反应残渣的形貌和化学组成。

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  • Through the study of mineragraphy and electron probe microanalysis, we found the existential status of silver having two types-visible and invisible, with mainly visible silver.

    通过矿相学、电子显微探针研究发现银均以不可见银和可见银两种形式存在,但以可见银为主。

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  • Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).

    通过X射线衍射分析(XRD)、扫描电镜(SEM)等观察分析了复合粉涂层表面形貌,分析了表面微裂纹和孔隙的形成过程。

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  • The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.

    采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。

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  • Methods the spatial distribution of the compositional elements in incipient enamel caries was obtained by spot selection, line and map analyses with electron probe microanalysis technique (EPMA).

    方法应用电子探针微区分析(EPMA)技术对初期釉质龋中化学成分的空间分布进行选定微区、线扫描及面扫描分析。

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  • The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).

    分别用电子探针(EPMA)、X衍射(XRD)和扫描电镜(SEM)查证了其组分、相结构和显微结构的梯度分布。

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  • METHODS: Electron probe quantitative and position microanalysis was used to measure the depth and element composition of the reaction layer of the Ti-porcelain.

    方法:利用电子探针定点定量分析方法测量钛瓷反应层厚度及元素构成情况。

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  • The present correction program was compared to other recently proposed correction procedure for quantitative electron-probe microanalysis.

    把我们的修正程序与其它几个最近提出的定量电子探针分析的修正程序作了比较。

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  • The correction programs for light elements quantitative electron-probe microanalysis have been performed.

    完成了轻元素定量电子探针分析的修正程序。

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  • The correction programs for light elements quantitative electron-probe microanalysis have been performed.

    完成了轻元素定量电子探针分析的修正程序。

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