Niobium oxide optical thin films have been prepared by low frequency reactive magnetron sputtering system.
利用低频反应磁控溅射制备五氧化二铌光学薄膜。
A novel large-stage atomic force microscope (AFM) for nondestructive characterization of optical thin films is built.
研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(afm)。
The original structure optimization of optical multilayer is important for the whole design of the optical thin films.
膜系初始结构优化设计是膜系优化设计的关键。
Low voltage high current reactive ion plating is a new progress in the field of optical thin films deposition techniques.
光学薄膜低压大电流反应离子镀技术是近年来光学薄膜技术领域中的最新进展。
A general calculating method of optical character of optical thin films, namely characteristic matrix method is stated concisely.
简要的叙述了光学薄膜光学特性的通用计算方法，即特征矩阵法。
We propose a new method to realize degenerate four-wave-mixing in nonlinear optical thin films using long-range surface-plasmons-wave as pumps.
本文提出一种以长程表面电磁激元波作为泵波，在非线性介质膜中实现简并四波混频的新方案。
In this paper, an instrument for detecting the distribution of the surface total integrated scattering (TIS) of the optical thin films is introduced.
介绍了一种检测光学薄膜表面总积分散射(TIS)分布的总积分散射仪。
This paper aims at finding out how to fabricate thin films optical waveguide and optical thin films by using this technology so as to lay a foundation for a further study.
本文旨在用离子自组装技术制备薄膜光波导和光学薄膜，为进一步的研究打下基础。
The polarization characteristics of the corner-cube prism for YAG laser are analyzed, and two kinds of optical thin films are designed to compensate its polarization properties.
用琼斯算法对YAG激光用全反射角立方反射镜的偏振特性进行了分析，并利用薄膜的偏振特性设计了两膜系对其进行了补偿；
People bring up higher requirements to the performance of optical thin films, and hence bring up a more serious challenge to the monitor accuracy during the thin film manufacture.
人们对光学薄膜的性能提出了更高的要求，从而也对薄膜制造的监控精度提出了更严峻的挑战。
The design of optical thin films also faces a severe challenge. Not only so many requests on spectrum are brought up, but also the layer number of optical thin film will be larger.
不仅对光学薄膜的光谱特性提出各种不同的要求，而且所需要的膜系层数日益增大，设计要求超出传统的解析设计所具备的能力。
The guided wave optical method can be applied to measurement of characteristic parameters of optical thin films, but usually can only be carried out under the conditions of single wavelength.
导波光学方法能够用来测量光学薄膜的特征参数，但通常只在单一波长条件下进行。
Based on the principle of elasticity and strain misfit, a new calculation method of theoretical model to predict the residual stress distribution on optical thin films is put forward in this paper.
根据弹性力学原理，基于应变不匹配，提出了一种可以预测薄膜残余应力分配的理论模型计算方法，并将计算结果与干涉仪测量值进行了对比。
Based on the principle of elasticity and strain misfit, a new calculation method of theoretical model to predict the residual stress distribution on optical thin films is put forward in this paper.
根据弹性力学原理，基于应变不匹配，提出了一种可以预测薄膜残余应力分配的理论模型计算方法，并将计算结果与干涉仪测量值进行了对比。
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