Their structure, morphology and components have been characterized using transmission electron microscope(TEM), X-rays diffraction(XRD), and X-rays photoelectron spectrometer(XPS).
利用透射电镜（TEM）、X射线衍射（XRD）、X射线光电子谱，表征了金纳米粉末的结构、形貌及其化学组分。
Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The atomization mechanism of europium nitrate on graphite probe surface in graphite furnace was investigated experimentally by X-ray diffraction spectrometry and X-ray photoelectron spectrometry.
用x -射线衍射分析与X -射线光电子能谱分析研究了硝酸铕在石墨炉内石墨探针表面原子化机理。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
X-ray photoelectron spectroscopy and X-ray diffraction were used to analyze the chemical structure of the DLC films containing ti.
通过X射线光电子能谱及X射线衍射表征了薄膜的化学结构。
Specific frequency used by inductively coupled plasma emission spectroscopy, X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, cyclic voltammetry methods.
具体采用了电感耦合高频等离子体发射光谱、X射线衍射、拉曼光谱、X射线光电子能谱、循环伏安测试手段。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
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