Recently, reducing test application time and test data volume is a direction of effort in SoC design .
目前，减少测试应用时间和测试数据容量是测试领域的努力方向。
There are three serious problems: These are test application time, test data volume, and test power consumption.
其中比较严重的问题有三个：它们分别是测试时间、测试数据量和测试功耗。
There are three serious problems: These are test application time, test data volume, and test power consumption.
其中比较严重的问题有三个：它们分别是测试时间、测试数据量和测试功耗。
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