In case of deviation of the measured average thickness from the specified average value, the Wafer Yield adjustment has to come into force.
万一出现，测量的平均厚度与技术要求的平均厚度出现偏差，晶片的成品率必须进行调整。
In case of deviation of the measured average thickness from the specified average value, the Wafer Yield adjustment has to come into force.
万一出现，测量的平均厚度与技术要求的平均厚度出现偏差，晶片的成品率必须进行调整。
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