DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently.
直流参数测试是集成电路测试技术的重要组成部分，能够快速有效的检测芯片的性能，受到集成电路测试行业的高度重视。
The presented approach can not only diagnose both catastrophic faults and parametric faults, but also can be applied for both DC test and ac test.
该方法不仅能够同时诊断元件的硬故障和参数偏移故障，而且能够同时运用于直流测试和交流测试。
The presented approach can not only diagnose both catastrophic faults and parametric faults, but also can be applied for both DC test and ac test.
该方法不仅能够同时诊断元件的硬故障和参数偏移故障，而且能够同时运用于直流测试和交流测试。
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